• DocumentCode
    885146
  • Title

    Current instability above the Gunn threshold

  • Author

    Shaw, M.P.

  • Volume
    54
  • Issue
    11
  • fYear
    1966
  • Firstpage
    1580
  • Lastpage
    1581
  • Keywords
    Circuit testing; Electrons; Gallium arsenide; Gunn devices; Physics; RLC circuits; Resonant frequency; Temperature distribution; Threshold voltage; Time frequency analysis;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1966.5198
  • Filename
    1447128