Title :
Properties of Threshold Functions
Author_Institution :
David Sarnoff Research Center, RCA Labs., Princeton, N. J.
fDate :
4/1/1965 12:00:00 AM
Keywords :
Artificial intelligence; Automatic testing; Circuit synthesis; Cost accounting; Logic devices; Logic testing; Organizing; Probabilistic logic; Switching circuits; System testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1965.264255
