• DocumentCode
    885174
  • Title

    Electrostatics of nanowire transistors

  • Author

    Guo, Jing ; Wang, Jing ; Polizzi, Eric ; Datta, Supriyo ; Lundstrom, Mark

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    2
  • Issue
    4
  • fYear
    2003
  • Firstpage
    329
  • Lastpage
    334
  • Abstract
    The electrostatics of nanowire transistors are studied by solving the Poisson equation self-consistently with the equilibrium carrier statistics of the nanowire. For a one-dimensional, intrinsic nanowire channel, charge transfer from the metal contacts is important. We examine how the charge transfer depends on the insulator and the metal/semiconductor Schottky barrier height. We also show that charge density on the nanowire is a sensitive function of the contact geometry. For a nanowire transistor with large gate underlaps, charge transferred from bulk electrodes can effectively "dope" the intrinsic, ungated region and allow the transistor to operate. Reducing the gate oxide thickness and the source/drain contact size decreases the length by which the source/drain electric field penetrates into the channel, thereby, improving the transistor characteristics.
  • Keywords
    MOSFET; Poisson equation; SCF calculations; Schottky barriers; charge exchange; electrostatics; nanotechnology; Poisson equation; electrostatics; equilibrium carrier statistics; nanowire transistors; Carbon nanotubes; Charge transfer; Electrodes; Electrostatics; Geometry; Metal-insulator structures; Poisson equations; Schottky barriers; Silicon; Statistics;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2003.820518
  • Filename
    1264890