DocumentCode
885174
Title
Electrostatics of nanowire transistors
Author
Guo, Jing ; Wang, Jing ; Polizzi, Eric ; Datta, Supriyo ; Lundstrom, Mark
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
2
Issue
4
fYear
2003
Firstpage
329
Lastpage
334
Abstract
The electrostatics of nanowire transistors are studied by solving the Poisson equation self-consistently with the equilibrium carrier statistics of the nanowire. For a one-dimensional, intrinsic nanowire channel, charge transfer from the metal contacts is important. We examine how the charge transfer depends on the insulator and the metal/semiconductor Schottky barrier height. We also show that charge density on the nanowire is a sensitive function of the contact geometry. For a nanowire transistor with large gate underlaps, charge transferred from bulk electrodes can effectively "dope" the intrinsic, ungated region and allow the transistor to operate. Reducing the gate oxide thickness and the source/drain contact size decreases the length by which the source/drain electric field penetrates into the channel, thereby, improving the transistor characteristics.
Keywords
MOSFET; Poisson equation; SCF calculations; Schottky barriers; charge exchange; electrostatics; nanotechnology; Poisson equation; electrostatics; equilibrium carrier statistics; nanowire transistors; Carbon nanotubes; Charge transfer; Electrodes; Electrostatics; Geometry; Metal-insulator structures; Poisson equations; Schottky barriers; Silicon; Statistics;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2003.820518
Filename
1264890
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