DocumentCode :
885200
Title :
DC transfer characteristic, offset voltage sensitivities, and CMRR of FET differential stages
Author :
Zapf, Hans L.
Volume :
13
Issue :
2
fYear :
1978
fDate :
4/1/1978 12:00:00 AM
Firstpage :
262
Lastpage :
265
Abstract :
Using a simple square-law model of the field-effect transistor, the nonlinear dc transfer characteristic of FET differential stages is described for matched and unmatched input transistors. The input offset voltage sensitivities with respect to small imbalances of FET parameters and load device values are calculated for different load configurations. The common-mode rejection ratio (CMRR) is also considered.
Keywords :
Differential amplifiers; Field effect transistor circuits; Semiconductor device models; differential amplifiers; field effect transistor circuits; semiconductor device models; Differential amplifiers; Equations; FETs; Impedance matching; MOSFET circuits; Operational amplifiers; Production; Resistors; Threshold voltage; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1978.1051029
Filename :
1051029
Link To Document :
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