DocumentCode
885200
Title
DC transfer characteristic, offset voltage sensitivities, and CMRR of FET differential stages
Author
Zapf, Hans L.
Volume
13
Issue
2
fYear
1978
fDate
4/1/1978 12:00:00 AM
Firstpage
262
Lastpage
265
Abstract
Using a simple square-law model of the field-effect transistor, the nonlinear dc transfer characteristic of FET differential stages is described for matched and unmatched input transistors. The input offset voltage sensitivities with respect to small imbalances of FET parameters and load device values are calculated for different load configurations. The common-mode rejection ratio (CMRR) is also considered.
Keywords
Differential amplifiers; Field effect transistor circuits; Semiconductor device models; differential amplifiers; field effect transistor circuits; semiconductor device models; Differential amplifiers; Equations; FETs; Impedance matching; MOSFET circuits; Operational amplifiers; Production; Resistors; Threshold voltage; Virtual manufacturing;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1978.1051029
Filename
1051029
Link To Document