Radiation-induced increase in surface recombination velocity of thermally oxidized silicon structures
Author :
Fitzgerald, D.J.
Volume :
54
Issue :
11
fYear :
1966
Firstpage :
1601
Lastpage :
1602
Keywords :
Capacitance measurement; Current measurement; DC generators; Diodes; Distortion measurement; Force measurement; Silicon; Spontaneous emission; Velocity measurement; Voltage measurement;
