DocumentCode :
885490
Title :
Unilateral gain and stability criterion of active two-ports in terms of scattering parameters
Author :
Ku, W.H.
Volume :
54
Issue :
11
fYear :
1966
Firstpage :
1617
Lastpage :
1618
Keywords :
Frequency; Gain measurement; Impedance; Microwave measurements; Microwave transistors; Passive networks; Reflection; Scattering parameters; Stability criteria;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1966.5229
Filename :
1447159
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=885490
