• DocumentCode
    885973
  • Title

    Special Issue of IEEE Transactions on Device and Materials Reliability: “Negative Bias Temperature Instabilities”

  • Volume
    28
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    532
  • Lastpage
    532
  • Abstract
    Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2007.900199
  • Filename
    4212184
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=885973