• DocumentCode
    88614
  • Title

    Radiation Induced Conductivity in Teflon FEP Irradiated With Multienergetic Electron Beam

  • Author

    Hanna, Rachelle ; Paulmier, T. ; Molinie, P. ; Belhaj, M. ; Dirassen, B. ; Payan, Denis ; Balcon, Nicolas

  • Author_Institution
    ONERA (French Aerosp. Lab.), Toulouse, France
  • Volume
    41
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    3520
  • Lastpage
    3525
  • Abstract
    Teflon Fluorinated Ethylene Propylene (FEP), used as thermal blankets on satellites, has a specific electrical behavior under space ionizing environment. Charging behaviors of this dielectric material, under electron beam irradiation, is of special interest for future spacecraft needs. Hence, ground experimental parameters have been adjusted in order to distinguish between the different physical mechanisms that steers FEP charging potential. The effect of incident electron spectrum, electric field, and dose rate has been investigated through surface potential measurements during and after the irradiation process. The experimental results especially reveal that charging potential evolution as a function of time is not strongly dependent upon the electron spectrum and the electric field but varies noticeably with dose rate. These results have been analyzed in the light of a physical model that takes into account ionization, trapping/detrapping, and recombination mechanisms for negative and positive charges.
  • Keywords
    aerospace materials; artificial satellites; electrical conductivity; electron beam effects; FEP charging potential; Teflon FEP; Teflon Fluorinated Ethylene Propylene; multienergetic electron beam; radiation induced conductivity; satellites; space ionizing environment; thermal blankets; Conductivity; Electric potential; Electron beams; Plastics; Radiation effects; Surface charging; Charge transfer; conductivity; dielectric materials; radiation effects; space technology;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2287097
  • Filename
    6658948