• DocumentCode
    886196
  • Title

    Approximation of junction field-effect transistor characteristics by a hyperbolic function

  • Author

    Taki, Takashi

  • Volume
    13
  • Issue
    5
  • fYear
    1978
  • Firstpage
    724
  • Lastpage
    726
  • Abstract
    To analyze nonlinear circuits using the junction field-effect transistor (JFET), a new empirical equation is proposed to relate drain current to drain-source and gate-source voltages. This equation is a simpler form than the Shockley equations, and requires only drain characteristics to evaluate the constant /spl alpha/ in this equation. Good agreement is obtained between the predicted and experimental results.
  • Keywords
    Junction gate field effect transistors; Nonlinear network analysis; Semiconductor device models; junction gate field effect transistors; nonlinear network analysis; semiconductor device models; Circuit analysis; Circuit noise; Equations; Error analysis; FETs; Low-frequency noise; Low-noise amplifiers; PIN photodiodes; Shape; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1978.1051128
  • Filename
    1051128