• DocumentCode
    886406
  • Title

    The Effect of Parasitic Elements on Reflection Type Tunnel Diode Amplifier Performance

  • Author

    Scanlan, J.O. ; Lim, J.T.

  • Volume
    13
  • Issue
    6
  • fYear
    1965
  • fDate
    11/1/1965 12:00:00 AM
  • Firstpage
    827
  • Lastpage
    836
  • Abstract
    The effect of the tunnel diode series inductance and stray capacitance on the gain and bandwidth of broadband reflection type amplifiers is considered. General stability criteria imposed by these reactance are given together with realizability conditions for ideal (flat gain), Butterworth and Chebyshev responses. The main effect of the parasitic elements is to restrict the range of gain and bandwidth which may be achieved for a given number of elements in the matching network. The minimum gain is restricted together with both the maximum and minimum bandwidths. Comprehensive sets of curves are given which enable a rapid design of either Butterworth or Chebyshev response to be accomplished, and a procedure is given for conversion of the low-pass prototype network to band-pass form in the presence of the parasitic reactances. The frequency transformation is used to obtain an upper limit on the center frequency of the band-pass amplifier imposed by the parasitic. The use of the design data is illustrated by numerical examples.
  • Keywords
    Bandwidth; Broadband amplifiers; Chebyshev approximation; Diodes; Frequency; Inductance; Parasitic capacitance; Prototypes; Reflection; Stability criteria;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1965.1126113
  • Filename
    1126113