• DocumentCode
    886500
  • Title

    Clusters in Ionization Tracks of Electrons in Silicon Dioxide

  • Author

    Bradford, J.N.

  • Author_Institution
    Rome Air Development Center Solid State Sciences Division Hanscom AFB, MA 01731
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • Firstpage
    1271
  • Lastpage
    1275
  • Abstract
    An electron transport code is used to generate electron tracks in silicon dioxide. The location of all ionizing interactions is recorded and the distances between each pair of locations calculated. Application of elementary cluster analysis reveals the clustered nature of such tracks. The results for 600 keV primary electrons show a cluster pattern not compatible with the assumptions of columnar recombination or geminate recombination.
  • Keywords
    Charge carrier processes; Electrons; Insulation life; Ionization; Monte Carlo methods; Optical scattering; Particle scattering; Silicon compounds; Slabs; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1986.4334591
  • Filename
    4334591
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=886500