Title :
Clusters in Ionization Tracks of Electrons in Silicon Dioxide
Author_Institution :
Rome Air Development Center Solid State Sciences Division Hanscom AFB, MA 01731
Abstract :
An electron transport code is used to generate electron tracks in silicon dioxide. The location of all ionizing interactions is recorded and the distances between each pair of locations calculated. Application of elementary cluster analysis reveals the clustered nature of such tracks. The results for 600 keV primary electrons show a cluster pattern not compatible with the assumptions of columnar recombination or geminate recombination.
Keywords :
Charge carrier processes; Electrons; Insulation life; Ionization; Monte Carlo methods; Optical scattering; Particle scattering; Silicon compounds; Slabs; Spontaneous emission;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1986.4334591
