DocumentCode
886707
Title
Analysis of the Ion Spot Phenomenon on Beam-Charged Dielectrics
Author
McKeil, Gordon ; Balmain, K.G.
Author_Institution
Department of Electrical Engineering University of Toronto Toronto, Canada M5S 1A4
Volume
33
Issue
6
fYear
1986
Firstpage
1396
Lastpage
1401
Abstract
Computer simulation of particle trajectories in two dimensions using a simple static accumulated charge model reveals the mechanism for the focussing of ions into a central, sharply defined "spot", duplicating the luminescent spot which did not arc-discharge observed during laboratory exposure of polymer film to monoenergetic electrons and low energy ions. A model which follows the time evolution of such charging situations is developed and initial results are presented.
Keywords
Aircraft manufacture; Apertures; Computer simulation; Dielectrics; Electron beams; Insulation; Laboratories; Luminescence; Polymers; Strips;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1986.4334612
Filename
4334612
Link To Document