DocumentCode :
88676
Title :
GaN HEMT: Dominant Force in High-Frequency Solid-State Power Amplifiers
Author :
Komiak, James J.
Author_Institution :
Electron. Syst., BAE Syst., Nashua, NH, USA
Volume :
16
Issue :
3
fYear :
2015
fDate :
Apr-15
Firstpage :
97
Lastpage :
105
Abstract :
The gallium nitride (GaN) high-electron-mobility transistor (HEMT) has emerged as the dominant force in high-frequency solid-state power amplifiers (PAs)-not that it does not have competition. Silicon (Si) bipolar junction transistors (BJTs) and Si laterally diffused metal-oxide-semiconductor (LDMOS) field-effect transistors (FETs) are still commercially available. They are viable alternatives to GaN HEMTs in aerospace/defense applications such as L-band transponders/interrogators for the identification friend or foe; Link 16 data links; electronic warfare; and surveillance radar; and, in the case of Si LDMOSs, commercial cellular base stations. These older technologies can be favored due to their mature heritage, good performance, and low cost. The pseudomorphic HEMT (PHEMT) is ubiquitous in microwave and millimeter-wave power applications. Vacuum electron devices (VEDs) still reign in the regime of brute power. The GaN HEMT has been displacing these technologies as it has matured and costs have come down.
Keywords :
HF amplifiers; III-V semiconductors; MOSFET; bipolar transistors; elemental semiconductors; gallium compounds; high electron mobility transistors; microwave power amplifiers; silicon; wide band gap semiconductors; GaN; GaN HEMT; PHEMT; Si; Si BJT; Si LDMOS field-effect transistors; Si laterally diffused metal-oxide-semiconductor FET; VED; gallium nitride high-electron-mobility transistor; high-frequency solid-state power amplifiers; microwave-wave power applications; millimeter-wave power applications; pseudomorphic HEMT; silicon bipolar junction transistors; vacuum electron devices; Benchmark testing; Gallium arsenide; Gallium nitride; HEMTs; Logic gates; MMICs; Power amplifiers; Solid state circuits;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2014.2385303
Filename :
7054705
Link To Document :
بازگشت