Title :
Two Tests for the Linearity of Sequential Machines
Author_Institution :
Cornell University, Ithaca, N. Y.
Abstract :
This paper describes two tests for the existence of a linear state assignment for binary input sequential machines. The first test is based on ``transfer sequences´´ which map one stationary state of a machine onto another stationary state. It is shown that from a minimal transfer sequence of a machine one can read off directly a linear assignment of this machine if one exists. The second test uses ``ignorance´´ computations by means of partitions and previously developed results about sequential machine structure.
Keywords :
Computer network reliability; Convergence; Lattices; Linearity; Logic; Neural networks; Polynomials; Sequential analysis; Stationary state; System testing;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1965.264048