• DocumentCode
    886846
  • Title

    Thermal behavior of visible AlGaInP-GaInP ridge laser diodes

  • Author

    Martin, Olivier J F ; Bona, Gian-Luca ; Wolf, Peter

  • Author_Institution
    IBM Zurich Res. Lab., Ruschlikon, Switzerland
  • Volume
    28
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    2582
  • Lastpage
    2588
  • Abstract
    The thermal behavior of visible AlGaInP-GaInP ridge laser diodes was investigated numerically and experimentally. It is shown that various parameters critically influence the thermal resistance, R , of such devices. R is inversely proportional to the thermal conductivity of the heat sink. A substantial improvement in R is achieved for junction-side-down mounting compared to junction-side-up. R depends strongly on the width, w, of the ridge, and this effect is different for junction-side-up or junction-side-down mounting. In the first case, R~log(w) and in the second, R~1/w. The thickness of the soldering material is a sensitive parameter which may increase the value of R by up to 15 K/W. For junction-side-up mounted devices, the top metallization layer has a very favorable effect: a 1-μm-thick gold layer reduces R by 30%. It is shown that when a laser is switched on, the thermal steady state is reached in the millisecond time range. The experimental results show very good agreement with numerical data
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser theory; laser transitions; metallisation; semiconductor lasers; soldering; thermal conductivity of solids; thermal resistance; 1 micron; Au layer; III-V semiconductor; heat sink; junction side up mounting; junction-side-down mounting; soldering material; thermal behavior; thermal conductivity; thermal resistance; thermal steady state; top metallization layer; visible AlGaInP-GaInP ridge laser diodes; Diode lasers; Gold; Heat sinks; Inorganic materials; Metallization; Resistance heating; Soldering; Steady-state; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.161317
  • Filename
    161317