• DocumentCode
    886882
  • Title

    Latchup Paths in Bipolar Integrated Circuits

  • Author

    Baze, M.P. ; Johnston, A.H.

  • Author_Institution
    Boeing Aerospace Company Seattle, Washington 98124
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • Firstpage
    1499
  • Lastpage
    1504
  • Abstract
    A combination of experimental techniques was used to find latchup paths in bipolar circuits. Voltage contrast scanning electron microscopy was applied as an internal probe to analyze latchup paths. Data obtained on six device types show a variety of path combinations and interactions responsible for latchup.
  • Keywords
    Bipolar integrated circuits; Infrared imaging; Integrated circuit measurements; Linear accelerators; Linear particle accelerator; Optical pulses; Photoconductivity; Probes; Scanning electron microscopy; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1986.4334630
  • Filename
    4334630
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=886882