• DocumentCode
    887130
  • Title

    Static and dynamic noise margins of logic circuits

  • Author

    Lohstroh, Jan

  • Volume
    14
  • Issue
    3
  • fYear
    1979
  • fDate
    6/1/1979 12:00:00 AM
  • Firstpage
    591
  • Lastpage
    598
  • Abstract
    Explaining four basic types of noise, and by showing the various methods, together with boundary conditions, which can be used to find the worst case noise margins. A flip-flop setup is advised which can be used for measurements and computer simulations, both for static and dynamic noise margins. Also configurations with fan-in and fan-out larger than 1 can be handled with this flip-flop method. In general, it is found that the dynamic noise margins increase for shorter noise pulses; a first-order explanation of this phenomenon is given. Also, energy noise margins are considered. The theoretical considerations are completed with computer simulations and measurements of the static and dynamic noise margins of integrated Schottky logic (ISL), as an example.
  • Keywords
    Electron device noise; Integrated logic circuits; electron device noise; integrated logic circuits; Boundary conditions; Circuit noise; Computer simulation; Flip-flops; Impedance; Integrated circuit measurements; Logic circuits; Noise level; Noise measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1979.1051221
  • Filename
    1051221