DocumentCode
887130
Title
Static and dynamic noise margins of logic circuits
Author
Lohstroh, Jan
Volume
14
Issue
3
fYear
1979
fDate
6/1/1979 12:00:00 AM
Firstpage
591
Lastpage
598
Abstract
Explaining four basic types of noise, and by showing the various methods, together with boundary conditions, which can be used to find the worst case noise margins. A flip-flop setup is advised which can be used for measurements and computer simulations, both for static and dynamic noise margins. Also configurations with fan-in and fan-out larger than 1 can be handled with this flip-flop method. In general, it is found that the dynamic noise margins increase for shorter noise pulses; a first-order explanation of this phenomenon is given. Also, energy noise margins are considered. The theoretical considerations are completed with computer simulations and measurements of the static and dynamic noise margins of integrated Schottky logic (ISL), as an example.
Keywords
Electron device noise; Integrated logic circuits; electron device noise; integrated logic circuits; Boundary conditions; Circuit noise; Computer simulation; Flip-flops; Impedance; Integrated circuit measurements; Logic circuits; Noise level; Noise measurement; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1979.1051221
Filename
1051221
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