• DocumentCode
    887328
  • Title

    Analytical comparison of sensor signal processing enhancements for NDT synthetic aperture ultrasonic imaging

  • Author

    Silverstein, Seth D. ; Thomas, Lewis J.

  • Author_Institution
    GE Corp. Res. & Dev., Schenectady, NY, USA
  • Volume
    2
  • Issue
    1
  • fYear
    1993
  • fDate
    1/1/1993 12:00:00 AM
  • Firstpage
    60
  • Lastpage
    67
  • Abstract
    The results of a detailed analytical study of the effects of sensor processing techniques on clutter suppression and image enhancement for nondestructive testing (NDT) systems are presented. A relatively simple beamforming/diffraction model is developed for near-field, wideband, synthetic aperture ultrasonic imaging in NDT systems. The physical model is used to quantitatively evaluate a variety of front-end sensor signal processing tradeoffs for the enhanced detection and sizing of defects. It is shown using statistical microscopic scattering calculations that a combination of increased spatial sampling and rectangular windowing can increase the signal-to-clutter ratio by ~10 dB while maintaining crack size resolutions well below future projected specifications. The sensor signal processing image enhancements are demonstrated by the construction of simulated strip-map SAFT (synthetic aperture focusing technique) images of metallic crack defects in the presence of large numbers of randomly distributed clutter (simulated grain boundary) scatterers
  • Keywords
    acoustic imaging; acoustic signal processing; clutter; crack detection; image processing; interference suppression; ultrasonic materials testing; NDT; beamforming/diffraction model; clutter suppression; crack size resolutions; image enhancement; metallic crack defects; nondestructive testing; randomly distributed clutter scatterers; rectangular windowing; sensor signal processing enhancements; signal-to-clutter ratio; simulated grain boundary; simulated strip-map SAFT; spatial sampling; statistical microscopic scattering calculations; synthetic aperture focusing technique; synthetic aperture ultrasonic imaging; Array signal processing; Diffraction; Image analysis; Image enhancement; Image sensors; Nondestructive testing; Scattering; Sensor systems; Signal analysis; Signal processing;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/83.210866
  • Filename
    210866