DocumentCode :
887328
Title :
Analytical comparison of sensor signal processing enhancements for NDT synthetic aperture ultrasonic imaging
Author :
Silverstein, Seth D. ; Thomas, Lewis J.
Author_Institution :
GE Corp. Res. & Dev., Schenectady, NY, USA
Volume :
2
Issue :
1
fYear :
1993
fDate :
1/1/1993 12:00:00 AM
Firstpage :
60
Lastpage :
67
Abstract :
The results of a detailed analytical study of the effects of sensor processing techniques on clutter suppression and image enhancement for nondestructive testing (NDT) systems are presented. A relatively simple beamforming/diffraction model is developed for near-field, wideband, synthetic aperture ultrasonic imaging in NDT systems. The physical model is used to quantitatively evaluate a variety of front-end sensor signal processing tradeoffs for the enhanced detection and sizing of defects. It is shown using statistical microscopic scattering calculations that a combination of increased spatial sampling and rectangular windowing can increase the signal-to-clutter ratio by ~10 dB while maintaining crack size resolutions well below future projected specifications. The sensor signal processing image enhancements are demonstrated by the construction of simulated strip-map SAFT (synthetic aperture focusing technique) images of metallic crack defects in the presence of large numbers of randomly distributed clutter (simulated grain boundary) scatterers
Keywords :
acoustic imaging; acoustic signal processing; clutter; crack detection; image processing; interference suppression; ultrasonic materials testing; NDT; beamforming/diffraction model; clutter suppression; crack size resolutions; image enhancement; metallic crack defects; nondestructive testing; randomly distributed clutter scatterers; rectangular windowing; sensor signal processing enhancements; signal-to-clutter ratio; simulated grain boundary; simulated strip-map SAFT; spatial sampling; statistical microscopic scattering calculations; synthetic aperture focusing technique; synthetic aperture ultrasonic imaging; Array signal processing; Diffraction; Image analysis; Image enhancement; Image sensors; Nondestructive testing; Scattering; Sensor systems; Signal analysis; Signal processing;
fLanguage :
English
Journal_Title :
Image Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7149
Type :
jour
DOI :
10.1109/83.210866
Filename :
210866
Link To Document :
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