Multistage interconnection network reliability

Author

Blake, James T. ; Trivedi, Kishor S.

Author_Institution

AIRMICS, Atlanta, GA, USA

Volume

38

Issue

11

fYear

1989

fDate

11/1/1989 12:00:00 AM

Firstpage

1600

Lastpage

1604

Abstract

The authors examine the reliability of a unique-path multistage interconnection network (MIN) and a fault-tolerant scheme aimed at improving system reliability. They derive closed-form expressions for the time-dependent reliability of the 8×8 and 16×16 shuffle-exchange multistage interconnection networks (SENs) and SENs with an addition state (SEN+). These expressions are derived without any assumptions regarding the underlying component-lifetime distributions. They derive a tight reliability lower bound that is useful for the analysis of larger networks. They provide numerical results for networks as large as 1024×1024

Keywords

circuit reliability; computational complexity; fault tolerant computing; multiprocessor interconnection networks; SEN+; SENs; component-lifetime distributions; fault-tolerant scheme; shuffle-exchange multistage interconnection networks; system reliability; tight reliability lower bound; time-dependent reliability; unique-path multistage interconnection network; Books; Computer network reliability; Data engineering; Failure analysis; Fault tolerance; Multiprocessor interconnection networks; Performance analysis; Reliability engineering; Switches; Transient analysis;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.42134

Filename

42134