Title :
Guest Editor´s Introduction: Evolving Methods for Detecting and Handling Reliability Defects
Author_Institution :
IBM Microelectronics
Abstract :
Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.
Keywords :
DPPM; burn-in; defect acceleration; latent defects; latent-defect screening; reliability defects; Acceleration; Costs; Failure analysis; Manufacturing industries; Microelectronics; Optimization methods; Semiconductor device reliability; Stress; Testing; Voltage; DPPM; burn-in; defect acceleration; latent defects; latent-defect screening; reliability defects;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.41
