• DocumentCode
    888041
  • Title

    Compact BIC sensor for Iddq testing of CMOS circuits

  • Author

    Lupon, Emili ; Gorriz, G. ; Martinez, Carlos ; Figueras, Jaume

  • Author_Institution
    Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    29
  • Issue
    9
  • fYear
    1993
  • fDate
    4/29/1993 12:00:00 AM
  • Firstpage
    772
  • Lastpage
    774
  • Abstract
    A compact built-in current sensor based on a slightly modified latch comparator is presented, which allows fast detection and memorising of excessively high quiescent current without the need for a voltage reference. Response time, virtual ground distortion and silicon overhead are analysed in order to evaluate the sensor performance.
  • Keywords
    CMOS integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; CMOS circuits; compact built-in current sensor; latch comparator; quiescent current detection; response time; silicon overhead; virtual ground distortion;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19930517
  • Filename
    211260
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=888041