DocumentCode
888269
Title
Testing of mixed-signal systems using dynamic stimuli
Author
Taylor, D. ; Evans, P.S.A. ; Pritchard, T.I.
Author_Institution
Huddersfield Univ., UK
Volume
29
Issue
9
fYear
1993
fDate
4/29/1993 12:00:00 AM
Firstpage
811
Lastpage
813
Abstract
The impulse response of a linear circuit element contains enough information to functionally characterise that element. A technique for comparison of observed and expected (reference) transient responses, which results in an absolute measure of device functionality, is presented. Comparisons of transient response test results with the results from existing test programs are also presented.
Keywords
electronic equipment testing; integrated circuit testing; mixed analogue-digital integrated circuits; transient response; device functionality; dynamic stimuli; impulse response; linear circuit element; mixed analogue/digital circuits; mixed-signal systems; transient responses;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19930542
Filename
211285
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