• DocumentCode
    888305
  • Title

    Hierarchically Nested Channels for Fast Squeezing Interfaces With Reduced Thermal Resistance

  • Author

    Brunschwiler, Thomas ; Kloter, Urs ; Linderman, Ryan J. ; Rothuizen, Hugo ; Michel, Bruno

  • Author_Institution
    IBM Zurich Res. Lab., Ruschlikon
  • Volume
    30
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    226
  • Lastpage
    234
  • Abstract
    We report on a simple method to improve bondline formation kinetics by means of a hierarchical set of channels patterned into one of the surfaces. The channel arrays are used to improve the gap squeezing and cooling of single and multiple flip-chip electronic modules with highly viscous fluids and thermal pastes or greases. They allow a fast formation of thin gaps or bond lines by reducing the pressure gradient in the thermal interface material as it moves in and out of the gap. Models describing the dynamics of Newtonian fluids in these "hierarchically nested channel" interfaces combine squeeze flow and Hagen-Poiseuille theories. Rapid bond-line formation is demonstrated for Newtonian fluids and selected particle-filled pastes. Modeling of particle-laden polymeric pastes includes Bingham and Hershel-Bulkley fluid properties. Bond-line formation and thermal resistance are improved particularly for high-viscosity high-thermal-conductivity interface materials created from higher-volumetric particle loadings or for thermal interface materials with smaller filler-particle diameters
  • Keywords
    Poiseuille flow; cooling; flip-chip devices; non-Newtonian fluids; thermal management (packaging); thermal resistance; Bingham fluid properties; Hagen-Poiseuille theories; Hershel-Bulkley fluid properties; Newtonian fluids; bondline formation kinetics; channel arrays; cooling; fast squeezing interfaces; gap squeezing; multiple flip-chip electronic modules; nested channels; particle-laden polymeric pastes; reduced thermal resistance; thermal interface material; thermal management; Bonding; Conducting materials; Contact resistance; Electronic packaging thermal management; Electronics cooling; Surface resistance; Thermal conductivity; Thermal management; Thermal resistance; Viscosity; Bondline thickness (BLT); fluid flow; interface; interface aging; microchannel; packaging; thermal interface material (TIM); thermal management; thermal resistance; viscosity;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2007.897991
  • Filename
    4214928