• DocumentCode
    888517
  • Title

    Test-cost sensitive classification on data with missing values

  • Author

    Yang, Qiang ; Ling, Charles ; Chai, Xiaoyong ; Pan, Rong

  • Author_Institution
    Dept. of Comput. Sci., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • Volume
    18
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    626
  • Lastpage
    638
  • Abstract
    In the area of cost-sensitive learning, inductive learning algorithms have been extended to handle different types of costs to better represent misclassification errors. Most of the previous works have only focused on how to deal with misclassification costs. In this paper, we address the equally important issue of how to handle the test costs associated with querying the missing values in a test case. When an attribute contains a missing value in a test case, it may or may not be worthwhile to take the extra effort in order to obtain a value for that attribute, or attributes, depending on how much benefit the new value bring about in increasing the accuracy. In this paper, we consider how to integrate test-cost-sensitive learning with the handling of missing values in a unified framework that includes model building and a testing strategy. The testing strategies determine which attributes to perform the test on in order to minimize the sum of the classification costs and test costs. We show how to instantiate this framework in two popular machine learning algorithms: decision trees and naive Bayesian method. We empirically evaluate the test-cost-sensitive methods for handling missing values on several data sets.
  • Keywords
    belief networks; decision trees; learning (artificial intelligence); pattern classification; data classification; decision tree; inductive learning; machine learning; misclassification error; naive Bayesian method; test-cost-sensitive learning; Bayesian methods; Classification tree analysis; Costs; Decision trees; Error correction; Learning systems; Machine learning algorithms; Medical diagnostic imaging; Performance evaluation; Testing; Cost-sensitive learning; decision trees; naive Bayes.;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2006.84
  • Filename
    1613866