• DocumentCode
    888551
  • Title

    Charge transfer and blooming suppression of charge transfer photodiode area array

  • Author

    Tseng, Hsin-Fu ; Weckler, Gene P. ; Li, Sheng S.

  • Volume
    15
  • Issue
    2
  • fYear
    1980
  • fDate
    4/1/1980 12:00:00 AM
  • Firstpage
    206
  • Lastpage
    213
  • Abstract
    A charge-transfer photodiode array combines the advantages of diffused diodes for broad and smooth spectral response and analog registers for low-noise readout. The device structure described is that of a high-speed low-blooming 100-by-100 diode array using bucket-brigade readout registers. Two of the mechanisms which are essential to successful operation of this combination structure are studied. These mechanisms are the charge transfer from sensing diode to the analog register and blooming suppression. It is found that the charge-transfer speed degrades sharply with reducing light level due to subthreshold leakage behavior of the MOS transfer gate. This degradation is eliminated by using a background charge supplied from the analog register. Experimental data confirms the validity of the concept.
  • Keywords
    Image sensors; Photodiodes; Shift registers; image sensors; photodiodes; shift registers; Charge transfer; Costs; Degradation; Image sensors; Photodiodes; Semiconductor diodes; Shift registers; Solid state circuits; Switches; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1980.1051364
  • Filename
    1051364