Picosecond charge-collection dynamics in GaAs MESFETs [for space application]

Author

McMorrow, Dale ; Melinger, Joseph S. ; Knudson, Alvin R. ; Campbell, Arthur B. ; Weatherford, Todd ; Tran, Lan Hu ; Curtice, Walter R.

Author_Institution

US Naval Res. Lab., Washington, DC, USA

Volume

39

Issue

6

fYear

1992

fDate

12/1/1992 12:00:00 AM

Firstpage

1657

Lastpage

1664

Abstract

Ion and picosecond laser induced charge-collection measurements performed as a function of temperature and device bias conditions reveal the significant changes that occur in the charge collection transients as a function of these parameters. The temperature-dependent results provide new evidence that above-bandgap picosecond laser excitation can reproduce the primary features of the ion induced charge-collection transients measured for GaAs MESFETs. Bias dependence results reveal clearly the sensitive role of the device operating point in determining both the shape and the total integrated intensity of the measured charge-collection transients. Preliminary two-dimensional computer simulation results are presented which suggest carrier-induced channel modulation as the primary mechanism for enhanced charge collection in GaAs MESFETs

Keywords

III-V semiconductors; Schottky gate field effect transistors; aerospace instrumentation; aerospace testing; environmental testing; gallium arsenide; ion beam effects; laser beam effects; radiation hardening (electronics); semiconductor device testing; GaAs devices; III-V semiconductor; SEU; above-bandgap picosecond laser excitation; carrier-induced channel modulation; charge collection transients; ion induced charge-collection transients; picosecond laser induced charge-collection; space application; temperature-dependent results; two-dimensional computer simulation; Charge measurement; Current measurement; Gallium arsenide; Laser excitation; Laser transitions; MESFETs; Performance evaluation; Shape measurement; Space charge; Temperature;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.211350

Filename

211350