Title :
The impact of ASIC devices on the SEU vulnerability of space-borne computers
Author :
Koga, R. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Pinkerton, S.D. ; Tsubota, T.K.
Author_Institution :
Aerospace Corp., El Segundo, CA, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
Application-specific integrated circuits (ASICs) offer a number of advantages over traditional multicomponent microcircuits, including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset (SEU) and latchup are reported and are compared to the susceptibilities of the devices that they would replace. This comparison leads to a discussion of the impact of ASIC devices on the SEU susceptibility of spaceborne computers
Keywords :
application specific integrated circuits; ion beam effects; large scale integration; logic arrays; proton effects; radiation hardening (electronics); ASIC devices; CMOS; SEU vulnerability; cosmic ray induced SEU; gate arrays; latchup; space-borne computers; trapped proton induced SEU; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Field programmable gate arrays; Large scale integration; Logic devices; Power dissipation; Programmable logic arrays; Single event upset; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
