• DocumentCode
    888616
  • Title

    Dust test results on multicontact circuit board connectors

  • Author

    DeNure, Douglas G. ; Sproles, Edward S., Jr.

  • Author_Institution
    AT&T Bell Labs., Whippany, NJ, USA
  • Volume
    14
  • Issue
    4
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    802
  • Lastpage
    808
  • Abstract
    A study to determine if the normal force of a connector is a factor in maintaining a low contact resistance after an accumulation of dust in the pins and receptacles is discussed. A dust mixture of hygroscopic salts and natural mineral particles was used. The test connectors included the standard 2-mm connector with a nominal normal force of 0.55 N, a special 2-mm connector with an extra low normal force of 0.35 N, and another connector with a normal force of about 1.5 N. Resistance values, as compared with values measured before the dust exposure, increased by less than 4 mΩ for the contact pair showing the largest increase. The results indicate that the lower normal force in high-density connectors does not adversely affect the ability of the connector system to tolerate particulate contaminants
  • Keywords
    contact resistance; dust; electric connectors; printed circuit accessories; printed circuit testing; dust mixture; dust test; high-density connectors; hygroscopic salts; low contact resistance; multicontact circuit board connectors; natural mineral particles; normal force; particulate contaminants; Circuit testing; Connectors; Contact resistance; Electrical resistance measurement; Force measurement; Measurement standards; Minerals; Pins; Pollution measurement; Printed circuits;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.105137
  • Filename
    105137