DocumentCode
888842
Title
Built-in test for complex digital integrated circuits
Author
Könemann, Bernd ; Zwiehoff, Günther ; Mucha, Joachim
Volume
15
Issue
3
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
315
Lastpage
319
Abstract
A method for testing the logic function of complex digital integrated circuits is presented. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g., registers). The feasibility of the proposed method is demonstrated by results from both hardware simulation and logic simulation. The method is based on an adapted version of signature analysis, and on circuit partitioning (the structure of VLSI circuits is assumed to be inherently modular).
Keywords
Digital integrated circuits; Integrated circuit testing; Large scale integration; digital integrated circuits; integrated circuit testing; large scale integration; Built-in self-test; Circuit analysis; Circuit simulation; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit testing; Logic functions; Logic testing; Registers;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1980.1051391
Filename
1051391
Link To Document