DocumentCode :
888843
Title :
Survivability of high-Tc microwave devices in space radiation environments
Author :
Jackson, E.M. ; Weaver, B.D. ; Maisch, W.G. ; Summers, G.P.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Volume :
39
Issue :
6
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
1865
Lastpage :
1868
Abstract :
In order to investigate the suitability of high-Tc devices for satellite applications, a High Temperature Superconductivity Space Experiment (HTSSE I) is due for launch in 1993. The purpose of the present study is to examine the effect of nonionizing radiation on the performance of high-Tc devices intended for deployment on HTSSE I. A low-temperature radiation damage study of first-generation passive microwave devices fabricated from high-temperature cuprate superconductors has been performed in order to examine the effects of nonionizing radiation damage. Changes in performance due to radiation-induced shifts in the transition temperature and to film erosion are discussed. The results show that if these relatively simple passive devices are reasonably well shielded, they should survive in typical five-year space applications
Keywords :
aerospace instrumentation; directional couplers; high-temperature superconductors; microstrip components; microwave filters; proton effects; resonators; superconducting microwave devices; superconducting transition temperature; HTSC; High Temperature Superconductivity Space Experiment; band pass filter; directional coupler; film erosion; first-generation passive microwave devices; high-Tc microwave devices; low-temperature radiation damage; microstrip components; nonionizing radiation; proton irradiation; radiation-induced shifts; ring resonator; satellite applications; space radiation environments; transition temperature; Directional couplers; Extraterrestrial measurements; Frequency; Insertion loss; Microwave devices; Protons; Resonance; Resonator filters; Superconducting transition temperature; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.211379
Filename :
211379
Link To Document :
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