DocumentCode :
888969
Title :
Stress Effects on Thin-Film Parametrons
Author :
Ulzurrun, Eduardo Tomas
Author_Institution :
Electronics Division of the National Cash Register Company, Hawthorne, Calif.
Issue :
4
fYear :
1966
Firstpage :
647
Lastpage :
657
Abstract :
An analysis of the dynamic behavior of a thin-film parametron is derived from the Landau-Lifshitz and the circuit nodal equations. The effect of stresses on the thin film is included in the mathematical model and the resultant equations are solved numerically by the Runge-Kutta method, without making any assumption about the nature of the solution. The initial conditions used to start the computation are also obtained numerically, solving the same equation for the particular case of zero pump field. Solutions for various values of stress are given, electrical and magnetic parameters are plotted, and the effect of stresses on the waveforms are discussed. A detailed analysis of the energy transfer in the unstressed case is presented. Experimental waveforms from a cylindrical thin-film parametron which was tested under conditions similar to those used in the computation are presented. Computed and experimental waveforms show excellent quantitative and qualitative agreement.
Keywords :
Equations; Magnetic analysis; Magnetic anisotropy; Magnetization; Magnetostriction; Perpendicular magnetic anisotropy; Stress; Thin film circuits; Transistors; Wire;
fLanguage :
English
Journal_Title :
Electronic Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0367-7508
Type :
jour
DOI :
10.1109/PGEC.1966.264388
Filename :
4038839
Link To Document :
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