• DocumentCode
    888969
  • Title

    Stress Effects on Thin-Film Parametrons

  • Author

    Ulzurrun, Eduardo Tomas

  • Author_Institution
    Electronics Division of the National Cash Register Company, Hawthorne, Calif.
  • Issue
    4
  • fYear
    1966
  • Firstpage
    647
  • Lastpage
    657
  • Abstract
    An analysis of the dynamic behavior of a thin-film parametron is derived from the Landau-Lifshitz and the circuit nodal equations. The effect of stresses on the thin film is included in the mathematical model and the resultant equations are solved numerically by the Runge-Kutta method, without making any assumption about the nature of the solution. The initial conditions used to start the computation are also obtained numerically, solving the same equation for the particular case of zero pump field. Solutions for various values of stress are given, electrical and magnetic parameters are plotted, and the effect of stresses on the waveforms are discussed. A detailed analysis of the energy transfer in the unstressed case is presented. Experimental waveforms from a cylindrical thin-film parametron which was tested under conditions similar to those used in the computation are presented. Computed and experimental waveforms show excellent quantitative and qualitative agreement.
  • Keywords
    Equations; Magnetic analysis; Magnetic anisotropy; Magnetization; Magnetostriction; Perpendicular magnetic anisotropy; Stress; Thin film circuits; Transistors; Wire;
  • fLanguage
    English
  • Journal_Title
    Electronic Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0367-7508
  • Type

    jour

  • DOI
    10.1109/PGEC.1966.264388
  • Filename
    4038839