DocumentCode
888969
Title
Stress Effects on Thin-Film Parametrons
Author
Ulzurrun, Eduardo Tomas
Author_Institution
Electronics Division of the National Cash Register Company, Hawthorne, Calif.
Issue
4
fYear
1966
Firstpage
647
Lastpage
657
Abstract
An analysis of the dynamic behavior of a thin-film parametron is derived from the Landau-Lifshitz and the circuit nodal equations. The effect of stresses on the thin film is included in the mathematical model and the resultant equations are solved numerically by the Runge-Kutta method, without making any assumption about the nature of the solution. The initial conditions used to start the computation are also obtained numerically, solving the same equation for the particular case of zero pump field. Solutions for various values of stress are given, electrical and magnetic parameters are plotted, and the effect of stresses on the waveforms are discussed. A detailed analysis of the energy transfer in the unstressed case is presented. Experimental waveforms from a cylindrical thin-film parametron which was tested under conditions similar to those used in the computation are presented. Computed and experimental waveforms show excellent quantitative and qualitative agreement.
Keywords
Equations; Magnetic analysis; Magnetic anisotropy; Magnetization; Magnetostriction; Perpendicular magnetic anisotropy; Stress; Thin film circuits; Transistors; Wire;
fLanguage
English
Journal_Title
Electronic Computers, IEEE Transactions on
Publisher
ieee
ISSN
0367-7508
Type
jour
DOI
10.1109/PGEC.1966.264388
Filename
4038839
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