DocumentCode
889157
Title
OXIL, A Versatile Bipolar VLSI Technology
Author
Agraz-Güereña, Jorge ; Panousis, Peter T. ; Morris, B.L.
Volume
15
Issue
4
fYear
1980
fDate
8/1/1980 12:00:00 AM
Firstpage
462
Lastpage
466
Abstract
A bipolar VLSI technology, for Oxide Isolated Logic (OXIL) circuits has been developed which combines high-frequency conventional down-transistors with inverted up-transistors which are fabricated in a common process on the same chip site. The up-transistor is especially designed to optimize I2L circuits for high packing density, speed, and performance. High-pressure-steam oxide isolation and an up-diffused active base are combined to fabricate the up-transistor with ft > 500 MHz and Beta = 100, which allows I2L delays down to 3 ns at FO = 1 and 7 ns at FO = 6. The down-transistor is an oxide-isolated implanted-base transistor with an As emitter. It exhibits gains of 100-150 at ft = 2 GHz and supports subnanosecond CML, high-current buffer circuitry, and linear interfacing.
Keywords
Bipolar integrated circuits; Integrated circuit technology; Integrated logic circuits; Large scale integration; Bipolar transistors; Delay; Design optimization; Helium; Integrated circuit technology; Isolation technology; Logic circuits; Pulse inverters; Silicon; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1980.1051423
Filename
1051423
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