• DocumentCode
    889157
  • Title

    OXIL, A Versatile Bipolar VLSI Technology

  • Author

    Agraz-Güereña, Jorge ; Panousis, Peter T. ; Morris, B.L.

  • Volume
    15
  • Issue
    4
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    462
  • Lastpage
    466
  • Abstract
    A bipolar VLSI technology, for Oxide Isolated Logic (OXIL) circuits has been developed which combines high-frequency conventional down-transistors with inverted up-transistors which are fabricated in a common process on the same chip site. The up-transistor is especially designed to optimize I2L circuits for high packing density, speed, and performance. High-pressure-steam oxide isolation and an up-diffused active base are combined to fabricate the up-transistor with ft > 500 MHz and Beta = 100, which allows I2L delays down to 3 ns at FO = 1 and 7 ns at FO = 6. The down-transistor is an oxide-isolated implanted-base transistor with an As emitter. It exhibits gains of 100-150 at ft = 2 GHz and supports subnanosecond CML, high-current buffer circuitry, and linear interfacing.
  • Keywords
    Bipolar integrated circuits; Integrated circuit technology; Integrated logic circuits; Large scale integration; Bipolar transistors; Delay; Design optimization; Helium; Integrated circuit technology; Isolation technology; Logic circuits; Pulse inverters; Silicon; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1980.1051423
  • Filename
    1051423