• DocumentCode
    889215
  • Title

    Modeling the time-dependent transient radiation response of semiconductor junctions

  • Author

    Wunsch, T.F. ; Axness, C.L.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • Volume
    39
  • Issue
    6
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    2158
  • Lastpage
    2169
  • Abstract
    Analytical one-dimensional time-dependent photocurrent models are developed from new solutions to the ambipolar transport equation. The p-n junction model incorporates the effects of an electric field in the quasi-neutral region, finite diode length, and an arbitrary generation function g=f(x,t). It provides improved accuracy over the Wirth-Rogers and Enlow-Alexander models. An approximate photocurrent solution for p-n-n+, n-p-p+ , and p-i-n diode junctions is developed considering high-injection effects. Comparison with experimental data shows that a single set of physical parameters is adequate to characterize the model with respect to dose rate, pulse width, and geometry
  • Keywords
    electron beam effects; p-i-n diodes; p-n junctions; radiation effects; semiconductor device models; semiconductor diodes; transient response; ambipolar transport equation; analytical 1D time dependent photocurrent models; arbitrary generation function; electric field; electron beam irradiation; finite diode length; high-injection effects; n-p-p+ diode junctions; p-i-n diode junctions; p-n junction model; p-n-n+ diode junctions; quasi-neutral region; semiconductor junctions; time-dependent transient radiation response; Circuit analysis computing; Equations; Integrated circuit modeling; P-i-n diodes; P-n junctions; Photoconductivity; Semiconductor diodes; Semiconductor process modeling; Solid modeling; Space vector pulse width modulation;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.211417
  • Filename
    211417