DocumentCode
889215
Title
Modeling the time-dependent transient radiation response of semiconductor junctions
Author
Wunsch, T.F. ; Axness, C.L.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
39
Issue
6
fYear
1992
fDate
12/1/1992 12:00:00 AM
Firstpage
2158
Lastpage
2169
Abstract
Analytical one-dimensional time-dependent photocurrent models are developed from new solutions to the ambipolar transport equation. The p-n junction model incorporates the effects of an electric field in the quasi-neutral region, finite diode length, and an arbitrary generation function g =f (x ,t ). It provides improved accuracy over the Wirth-Rogers and Enlow-Alexander models. An approximate photocurrent solution for p-n-n+, n-p-p+ , and p-i-n diode junctions is developed considering high-injection effects. Comparison with experimental data shows that a single set of physical parameters is adequate to characterize the model with respect to dose rate, pulse width, and geometry
Keywords
electron beam effects; p-i-n diodes; p-n junctions; radiation effects; semiconductor device models; semiconductor diodes; transient response; ambipolar transport equation; analytical 1D time dependent photocurrent models; arbitrary generation function; electric field; electron beam irradiation; finite diode length; high-injection effects; n-p-p+ diode junctions; p-i-n diode junctions; p-n junction model; p-n-n+ diode junctions; quasi-neutral region; semiconductor junctions; time-dependent transient radiation response; Circuit analysis computing; Equations; Integrated circuit modeling; P-i-n diodes; P-n junctions; Photoconductivity; Semiconductor diodes; Semiconductor process modeling; Solid modeling; Space vector pulse width modulation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.211417
Filename
211417
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