DocumentCode
889375
Title
The Self-Diagnosability of a Computer
Author
Deo, Narsingh
Author_Institution
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, Calif.
Issue
5
fYear
1966
Firstpage
799
Lastpage
799
Abstract
Maximum capability for self-diagnosis with minimum additional hardware is the goal of every designer of a general purpose computer today. A yardstick with which the self-diagnosability of a system can be measured is proposed.
Keywords
Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault location; Hardware; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit testing; System testing;
fLanguage
English
Journal_Title
Electronic Computers, IEEE Transactions on
Publisher
ieee
ISSN
0367-7508
Type
jour
DOI
10.1109/PGEC.1966.264570
Filename
4038888
Link To Document