• DocumentCode
    889576
  • Title

    High-Speed MOS Gate Array

  • Author

    Nakaya, Masao ; Tomisawa, Osamu ; Ohkura, Isao ; Nakano, Takao

  • Volume
    15
  • Issue
    4
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    730
  • Lastpage
    735
  • Abstract
    The dimensions of the fundamental gate cell were analyzed in the gate-array type masterslice LSI which utilized the DSA MOS process combined with two-level metallization technology. It was revealed that the optimum gate width was 80 μm in the 4-μm design rule, taking the total power dissipation of 3 W and the deIay time below 2 ns into consideration. The delay times were measured from both the orginal design chip and the 80-percent linearly shrunk chips. In the shrunk chip operated at a 3-V power supply, the average gate delay time of 1.5 ns was obtained at a power dissipation of 1.2 mW/gate which gave three times better performance than the original design chip at 5-V power supply.
  • Keywords
    Field effect integrated circuits; Integrated logic circuits; Large scale integration; Logic gates; Metallisation; Charge coupled devices; Delay effects; Electron devices; Integrated circuit interconnections; Large scale integration; Logic; Power dissipation; Power supplies; Solid state circuits; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1980.1051461
  • Filename
    1051461