DocumentCode :
889576
Title :
High-Speed MOS Gate Array
Author :
Nakaya, Masao ; Tomisawa, Osamu ; Ohkura, Isao ; Nakano, Takao
Volume :
15
Issue :
4
fYear :
1980
fDate :
8/1/1980 12:00:00 AM
Firstpage :
730
Lastpage :
735
Abstract :
The dimensions of the fundamental gate cell were analyzed in the gate-array type masterslice LSI which utilized the DSA MOS process combined with two-level metallization technology. It was revealed that the optimum gate width was 80 μm in the 4-μm design rule, taking the total power dissipation of 3 W and the deIay time below 2 ns into consideration. The delay times were measured from both the orginal design chip and the 80-percent linearly shrunk chips. In the shrunk chip operated at a 3-V power supply, the average gate delay time of 1.5 ns was obtained at a power dissipation of 1.2 mW/gate which gave three times better performance than the original design chip at 5-V power supply.
Keywords :
Field effect integrated circuits; Integrated logic circuits; Large scale integration; Logic gates; Metallisation; Charge coupled devices; Delay effects; Electron devices; Integrated circuit interconnections; Large scale integration; Logic; Power dissipation; Power supplies; Solid state circuits; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1980.1051461
Filename :
1051461
Link To Document :
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