DocumentCode
889758
Title
A high performance sense amplifier for a 5 V dynamic RAM
Author
Barnes, John J. ; Chan, John Y.
Volume
15
Issue
5
fYear
1980
Firstpage
831
Lastpage
839
Abstract
Increasing dynamic RAM cell density and the use of a single low-voltage power supply have made it mandatory to store the full power supply voltage in the cell and to be able to detect smaller signals reliably with the initial sense amplifier. The authors present a circuit design approach that restores the cell to a full V/SUB DD/ `1´ level, preamplifies the initial charge imbalance before sensing by conventional techniques, and is used in the Fairchild 64K design. Design requirements and a detailed analysis of the amplifier are presented along with simulated results, followed by performance data. The circuit analysis shows how the key design parameters should be chosen and the effects of clock timing variations on the performance of the sense amplifier.
Keywords
Amplifiers; Field effect integrated circuits; Integrated memory circuits; Random-access storage; amplifiers; field effect integrated circuits; integrated memory circuits; random-access storage; Analytical models; Circuit analysis; Circuit simulation; Circuit synthesis; DRAM chips; Performance analysis; Power supplies; Signal detection; Signal restoration; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1980.1051479
Filename
1051479
Link To Document