Title :
Measurement of permittivity and dielectric loss in 2,4-dimethyl substituted pyridine using microwave cavity spectrometer and time domain reflectometer
Author :
Saxena, Saumya ; Sharma, Rajesh ; Manoj Johri ; Sanjeev Johri ; Johri, Sanjeev
Author_Institution :
Dept. of Biochem., Dr. Virendra Swarup Center of Appl. Sci. & Technol., Kanpur, India
Abstract :
Microwave cavity spectrometer and time domain reflectometer is used to measure the permittivity and dielectric loss at different temperatures in 2,4-dimethyl substituted pyridine. The observed data of the width of resonance profile and the shift in the resonance frequency have been analyzed using Slater perturbation equations for cavity spectrometer. The dielectric parameters measured from the time domain reflectometer as a function of time at different temperatures have been transformed to frequency domain to obtain the permittivity and dielectric loss. The observed values of the permittivity and dielectric loss at 9.0 GHz are fitted in Slater´s perturbation equations to obtain the form factor, which represents interactions. The relaxation time has been evaluated at different temperatures using the ratio of width and twice of frequency shift and thermodynamical parameters have been determined. This experimental study provides fruitful information about the bulk properties of 2,4-dimethyl substituted pyridine.
Keywords :
dielectric loss measurement; permittivity measurement; spectrometers; time-domain reflectometry; 9.0 GHz; Slater perturbation equations; dielectric loss measurement; dimethyl substituted pyridine; frequency domain; microwave cavity spectrometer; organic liquids; permittivity measurement; relaxation time; resonance frequency shift; resonance profile; thermodynamical parameters; time domain reflectometer; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrochemical impedance spectroscopy; Loss measurement; Microwave measurements; Permittivity measurement; Resonance; Temperature; Time measurement;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2004.1266333