Built-in self-diagnosis for repairable embedded RAMs

Author

Treuer, Robert ; Agarwal, Vinod K.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

Volume

10

Issue

2

fYear

1993

fDate

6/1/1993 12:00:00 AM

Firstpage

24

Lastpage

33

Abstract

A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.<>

Keywords

SRAM chips; built-in self test; integrated circuit testing; reduced instruction set computing; BISD; ROM; SRAMs; built-in self-diagnosis; design costs; diagnosis algorithms; external repair; hardware design; reduced-instruction-set processor; repairable embedded RAMs; static RAMs; stor capa 64 Kbit; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Fault detection; Fuses; Pins; Read-write memory;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/54.211525

Filename

211525