Title :
Impact of partial element accuracy on PEEC model stability
Author :
Ekman, Jonas ; Antonini, Giulio ; Orlandi, Antonio ; Ruehli, Albert E.
Author_Institution :
Dept. of Electr. Eng., Univ. of L´´Aquila
Abstract :
This paper details the impact of partial element accuracy on quasi-static partial element equivalent circuit (PEEC) model stability in the time domain. The potential sources of inaccurate partial element values are found to be poor geometrical meshing and the use of unsuitable partial element calculation routines. The impact on PEEC model stability of erroneous partial element values, and the coefficients of potential and partial inductances, are shown as theoretical constraints and practical results. Projection meshing, which is a discretization strategy suitable for the PEEC method, is shown to improve calculated partial element values for the same number of unknowns, thus improving model stability
Keywords :
circuit stability; equivalent circuits; circuit model stability; partial element accuracy; quasi-static partial element equivalent circuit; Circuit analysis; Circuit stability; Constraint theory; Electromagnetic modeling; Equivalent circuits; Geometry; Integral equations; Performance analysis; SPICE; Semiconductor device packaging; Partial element equivalent circuit (PEEC);
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2006.870699