Title :
A Modification of Lee´s Path Connection Algorithm
Author :
Akers, Sheldon B., Jr.
Author_Institution :
Electronics Laboratory, General Electric Company, Syracuse, N. Y.
Abstract :
It is shown that a set of diagnostic tests designed for a redundant circuit under the single-fault assumption is not necessarily a valid test set if a fault occurrence is preceded by the occurrence of some ( undetectable) redundant faults. This is an additional reason ( besides economy) for trying to eliminate certain kinds of redundancy from the circuit. However, single-fault analysis may remain valid for some types of redundancy which serve a useful purpose, such as the elimination of logic hazards in two-level circuits.
Keywords :
Joining processes; Printed circuits;
Journal_Title :
Electronic Computers, IEEE Transactions on
DOI :
10.1109/PGEC.1967.264620