• DocumentCode
    890510
  • Title

    Analytic Carrier-Based Charge and Capacitance Model for Long-Channel Undoped Surrounding-Gate MOSFETs

  • Author

    He, Jin ; Bian, Wei ; Tao, Yadong ; Yang, Shengqi ; Tang, Xu

  • Author_Institution
    Sch. of Electron. Eng. & Comput. Sci., Peking Univ., Beijing
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1478
  • Lastpage
    1485
  • Abstract
    Three terminal charges and nine intrinsic capacitances associated to the gate, source, and drain terminals of long-channel undoped surrounding-gate (SRG) MOSFETs are derived physically from an exact analytical solution of the channel current-continuity principle and channel charge-partition scheme in this paper. Although requiring lengthy and complex mathematical expressions, all explicit solutions for the capacitances can be obtained analytically. The validity of the analytical solutions is confirmed by comparing model predictions with simulation data obtained using the 3-D numerical solvers. The explicit expressions to the terminal charges and transcapacitance not only lead to a clearer understanding of SRG MOSFET device physics but also provide a better infrastructure to develop a complete carrier-based model for the SRG-MOSFET-based circuit simulation
  • Keywords
    MOSFET; numerical analysis; semiconductor device models; 3D numerical solvers; MOSFET device physics; capacitance model; carrier-based charge model; channel charge-partition scheme; channel current-continuity principle; circuit simulation; compact model; exact analytical solution; explicit expressions; intrinsic capacitances; long-channel undoped surrounding-gate MOSFET; terminal charges; CMOS technology; Capacitance; Circuit simulation; Computer science; Helium; MOSFETs; Microelectronics; Physics; Predictive models; Semiconductor device modeling; Carrier-based approach; compact model; device physics; nonclassical CMOS; surrounding-gate (SRG) MOSFET;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.896595
  • Filename
    4215177