DocumentCode
890530
Title
On the use of matrix algebra for the description of EPROM failures
Author
Morandi, C. ; Fantini, F.
Volume
16
Issue
2
fYear
1981
fDate
4/1/1981 12:00:00 AM
Firstpage
107
Lastpage
109
Abstract
A description of EPROM failures based on the use of Boolean matrices and operators is offered. It overcomes a number of problems which made previously available theories inapplicable to practical devices, and provides a useful tool for the analysis of test pattern efficiency.
Keywords
Boolean algebra; Failure analysis; Integrated memory circuits; Logic testing; Matrix algebra; PROM; failure analysis; integrated memory circuits; logic testing; matrix algebra; Circuit faults; Decoding; EPROM; Failure analysis; MOSFET circuits; Matrices; Read only memory; Solid state circuits; Testing; Very large scale integration;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1981.1051551
Filename
1051551
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