Title :
High-performance VLSI architecture of adaptive decision feedback equalizer based on predictive parallel branch slicer (PPBS) scheme
Author :
Yang, Meng-Da ; Wu, An-Yeu ; Lai, Jyh-Ting
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Among existing works of high-speed pipelined adaptive decision feedback equalizer (ADFE), the pipelined ADFE using relaxed look-ahead technique results in a substantial hardware saving than the parallel processing or Look-ahead approaches. However, it suffers from both the signal-to-noise ratio (SNR) degradation and slow convergence rate. In this paper, we employ the predictive parallel branch slicer (PPBS) to eliminate the dependencies of the present and past decisions so as to reduce the iteration bound of decision feedback loop of the ADFE. By adding negligible hardware complexity overheads, the proposed architecture can help to improve the output mean-square error (MSE) of the ADFE compared with the Relaxed Look-ahead ADFE architecture. Moreover, we show the superior performance of the proposed pipelined ADFE by using theoretical derivations and computer simulation results. A VLSI design example using Avant! 0.35-/spl mu/m CMOS standard cell library is also illustrated. From the post-layout simulation results, we can see that the PPBS scheme requires only 38.4% gate count overhead, but it can help to reduce the critical path from 7.06 to 4.69 ns so as to meet very high-speed data transmission systems.
Keywords :
CMOS integrated circuits; VLSI; adaptive equalisers; decision feedback equalisers; iterative methods; mean square error methods; transient response; CMOS standard cell; VLSI design; adaptive decision feedback equalizer; decision feedback loop; high-performance VLSI architecture; iteration bound; output mean-square error; pipelined architecture; predictive parallel branch slicer; prototyping chip; relaxed look-ahead DFE; sensitivity indexes; Computer architecture; Computer simulation; Convergence; Decision feedback equalizers; Degradation; Feedback loop; Hardware; Parallel processing; Signal to noise ratio; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2003.820521