• DocumentCode
    890684
  • Title

    Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel

  • Author

    Park, Choon-Sang ; Tae, Heung-Sik ; Kwon, Young-Kuk ; Heo, Eun Gi

  • Author_Institution
    Kyungpook Nat. Univ., Daegu
  • Volume
    54
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    1315
  • Lastpage
    1320
  • Abstract
    Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in both the image sticking and boundary image sticking cells. Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by Vt close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses.
  • Keywords
    magnesium compounds; phosphors; plasma displays; scanning electron microscopy; secondary ion mass spectroscopy; sputter deposition; surface discharges; time of flight mass spectroscopy; AC plasma display panel; MgO; boundary image sticking cells; discharge characteristics; discharge region; halo-type boundary image sticking; infrared-emission observations; luminance observations; nondischarge region; phosphor layer; scanning electron microscope analysis; sputter deposition; time-of-flight secondary ion mass spectrometry; visible-conversion characteristics; Business; Helium; Image analysis; Mass spectroscopy; Phosphors; Plasma displays; Scanning electron microscopy; Surface discharges; Surface morphology; Technological innovation; 42-in ac plasma display panel (PDP) module; $V_{t}$ close curve; Halo-type boundary image sticking; redeposition of Mg species; scanning electron microscope (SEM) analyses; time-of-flight secondary ion mass spectrometry (TOF-SIMS);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.896578
  • Filename
    4215194