DocumentCode :
890720
Title :
Microwave measurement of thin-film transducer coupling constant
Author :
Reeder, T.M.
Volume :
55
Issue :
6
fYear :
1967
fDate :
6/1/1967 12:00:00 AM
Firstpage :
1099
Lastpage :
1101
Abstract :
A method for measuring the transducer film coupling constant of microwave thin-film piezoelectric transducers is presented. Measured coupling constant data for a simple form of CdS transducer is reported, and is compared with published data for bulk, single crystals of CdS.
Keywords :
Acoustic measurements; Acoustic transducers; Delay lines; Frequency measurement; Microwave measurements; Microwave transistors; Piezoelectric films; Piezoelectric transducers; Resonance; Thin film circuits;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.5745
Filename :
1447675
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=890720
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