Mode quality factor based on far-field emission for square resonators

Author

Guo, Wei-Hua ; Huang, Yong-Zhen ; Lu, Qiao-Yin ; Yu, Li-Juan

Author_Institution

State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China

Volume

16

Issue

2

fYear

2004

Firstpage

479

Lastpage

481

Abstract

The quality factors of modes in square resonators are calculated based on the far-field emission of the analytical field distribution. The obtained quality factors are in reasonable agreement with those calculated by the finite-difference time-domain (FDTD) technique and Pade approximation method. The emission power in the square diagonal directions for whispering-gallery-like modes in square resonators is zero due to the interference cancellation caused by the odd field distributions relative to the diagonal mirror planes, so they have larger quality factors than the modes with even field distribution.

Keywords

Q-factor; laser cavity resonators; light interference; microcavity lasers; semiconductor lasers; FDTD technique; Pade approximation; analytical field distribution; diagonal mirror planes; emission power; far-field emission; finite-difference time-domain technique; interference cancellation; mode quality factor; odd field distribution; square diagonal directions; square resonators; whispering-gallery-like modes; Fiber lasers; Finite difference methods; Frequency; Laser modes; Magnetic confinement; Mirrors; Q factor; Resonator filters; Semiconductor lasers; Time domain analysis;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2003.822243

Filename

1266463