• DocumentCode
    891335
  • Title

    High voltage distribution measurements using different sphere gaps

  • Author

    Gohar, M.K.

  • Volume
    55
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    1232
  • Lastpage
    1233
  • Abstract
    A curve was deduced giving the maximum sphere gap against the sphere diameter so that the corresponding discharge potential will not depend on the positions of the spheres. The distortion effect in the original field was eliminated by extrapolating the results obtained to the case of a testing sphere of zero diameter.
  • Keywords
    Circuits; Collision mitigation; Materials testing; Mercury (metals); Semiconductor device testing; Semiconductor diodes; Semiconductor materials; System testing; Temperature; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5811
  • Filename
    1447741