DocumentCode :
891377
Title :
Digital logic-circuit applications of Gunn diodes
Author :
Hartnagel, H.L.
Volume :
55
Issue :
7
fYear :
1967
fDate :
7/1/1967 12:00:00 AM
Firstpage :
1236
Lastpage :
1237
Abstract :
Applications of the Gunn effect in logic-circuit devices are described, where the domain-nucleating field near a small negative electrode can be changed by a second small electrode. This leads to single-component devices such as a "comparator" and an "inhibitor," which have essential advantages over the corresponding conventional circuits.
Keywords :
Assembly; Circuit testing; Diodes; Electrodes; Electronic equipment testing; Employee welfare; Gunn devices; Logic devices; Stability; Voltage control;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.5816
Filename :
1447746
Link To Document :
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