• DocumentCode
    891377
  • Title

    Digital logic-circuit applications of Gunn diodes

  • Author

    Hartnagel, H.L.

  • Volume
    55
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    1236
  • Lastpage
    1237
  • Abstract
    Applications of the Gunn effect in logic-circuit devices are described, where the domain-nucleating field near a small negative electrode can be changed by a second small electrode. This leads to single-component devices such as a "comparator" and an "inhibitor," which have essential advantages over the corresponding conventional circuits.
  • Keywords
    Assembly; Circuit testing; Diodes; Electrodes; Electronic equipment testing; Employee welfare; Gunn devices; Logic devices; Stability; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.5816
  • Filename
    1447746
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=891377