Title :
Note on Reflectometer for Measuring the Magneto-Microwave Kerr Effect in Semiconductors (Correspondence)
Author :
Vernon, Ronald J.
fDate :
4/1/1968 12:00:00 AM
Keywords :
Attenuators; Capacitance; Coaxial components; Error correction; Frequency; Hybrid junctions; Kerr effect; Magnetic semiconductors; Microwave measurements; Rotation measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1968.1126664