Title :
0.5-Tb/s eye-diagram measurement by optical sampling using XPM-induced wavelength shifting in highly nonlinear fiber
Author :
Li, Jie ; Westlund, Mathias ; Sunnerud, Henrik ; Olsson, Bengt-Erik ; Karlsson, Magnus ; Andrekson, Peter A.
Author_Institution :
Dept. of Microtechnology & Nanoscience, Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
In this letter, we report on a novel all-optical sampling scheme using cross-phase modulation-induced wavelength shifting and optical filtering. Up to 500-Gb/s optical signal eye-diagram measurements have been demonstrated for the first time with a temporal resolution of 0.7 ps. Signal operational wavelength range covering basically the whole erbium-doped fiber amplifier gain range (1535-1569 nm) with temporal resolutions equal to or less than 1 ps was also demonstrated in the experiment. These results show that the sampling system is suitable for directly monitoring and evaluating ultrahigh bit-rate optical time-division multiplexed data at or above 160 Gb/s.
Keywords :
erbium; high-speed optical techniques; nonlinear optics; optical fibre amplifiers; optical fibre communication; optical fibre testing; optical filters; optical modulation; phase modulation; signal sampling; time division multiplexing; 0.5 Tbit/s; 0.5-Tb/s eye-diagram measurement; 1535 to 1569 nm; 160 Gbit/s; 500 Gbit/s; 500-Gb/s optical signal eye-diagram measurements; Er; XPM-induced wavelength shifting; cross-phase modulation-induced wavelength shifting; erbium-doped fiber amplifier gain; highly nonlinear fiber; optical filtering; optical sampling; optical signal processing; ultrahigh bit-rate optical time-division multiplexed data; Fiber nonlinear optics; Filtering; Nonlinear optics; Optical fiber filters; Optical filters; Optical modulation; Sampling methods; Signal resolution; Stimulated emission; Wavelength measurement;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.821088